发明名称 SHAPE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To measure the geometric feature parameters such as geometric tolerances of a minute object to be measured with pores and grooves of 100μm or less. SOLUTION: As bringing a probe 7 into contact with an object 4 to be measured from a predetermined direction under a measurement device coordinate system, a three-dimensional measuring device 1 acquires the three-dimensional coordinate data of the contact point. A data computing unit 100 performs coordinate transformation from the measurement device coordinate system to a reference coordinate system on the three-dimensional coordinate data through the use of the equation P0=R.Pm when R is a coordinate transformation matrix formed of a plurality of elements in four rows and four columns, Pm is the three-dimensional coordinate data acquired by the three-dimensional measuring device 1 in the measuring device coordinate system, and P0 is the three- dimensional coordinate data of the object 4 in the reference coordinate system.
申请公布号 JP2000028350(A) 申请公布日期 2000.01.28
申请号 JP19980200431 申请日期 1998.07.15
申请人 FUJI XEROX CO LTD 发明人 HIRONO AYUMI
分类号 G01B5/20;G01B5/012;G01B21/00;G01B21/20;(IPC1-7):G01B21/20 主分类号 G01B5/20
代理机构 代理人
主权项
地址