发明名称 COLLECTIVE SUBSTRATE FOR ACTIVE MATRIX SUBSTRATE
摘要 <p>PROBLEM TO BE SOLVED: To electrically inspect the active matrix substrate in its large size state as it is with high efficiency and high precision and to easily manufacture a probe frame for inspection at low cost. SOLUTION: A collective substrate 41 is divided into a 1st block 41A (cells A1, B1, and C1) and a 2nd block 41B (cells A2, B2, C2, A3, B3, and C3). To the respective cells of the 1st block 41A, a scanning signal for inspection is inputted to a scanning line 2 from a signal input pad group 37A through short- ring connection lines 32aA and 32bA for the scanning line, a display signal for inspection is inputted to the signal line 3 through a short-ring connection line 33A for the signal line, and a signal for auxiliary capacity wiring is inputted to an auxiliary capacity wire 4 through trunk wiring connection lines 34A and 34bA for the auxiliary capacity wire. To the cells of the 2nd block 41B, a scanning signal for inspection, a display signal for inspection, and a signal for auxiliary capacity wiring are inputted from a signal input pad group 37B to the scanning line 2, signal line 3, and auxiliary capacity wire 4 respectively.</p>
申请公布号 JP2000029067(A) 申请公布日期 2000.01.28
申请号 JP19980199227 申请日期 1998.07.14
申请人 SHARP CORP 发明人 NAGATA HISASHI;KATAYAMA MIKIO;YAMASHITA TOSHIHIRO;TAKAHAMA MANABU
分类号 G02F1/136;G02F1/13;G02F1/1333;G02F1/1343;G02F1/1345;G02F1/1368;H01L27/12;(IPC1-7):G02F1/136 主分类号 G02F1/136
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