摘要 |
<p>PROBLEM TO BE SOLVED: To electrically inspect the active matrix substrate in its large size state as it is with high efficiency and high precision and to easily manufacture a probe frame for inspection at low cost. SOLUTION: A collective substrate 41 is divided into a 1st block 41A (cells A1, B1, and C1) and a 2nd block 41B (cells A2, B2, C2, A3, B3, and C3). To the respective cells of the 1st block 41A, a scanning signal for inspection is inputted to a scanning line 2 from a signal input pad group 37A through short- ring connection lines 32aA and 32bA for the scanning line, a display signal for inspection is inputted to the signal line 3 through a short-ring connection line 33A for the signal line, and a signal for auxiliary capacity wiring is inputted to an auxiliary capacity wire 4 through trunk wiring connection lines 34A and 34bA for the auxiliary capacity wire. To the cells of the 2nd block 41B, a scanning signal for inspection, a display signal for inspection, and a signal for auxiliary capacity wiring are inputted from a signal input pad group 37B to the scanning line 2, signal line 3, and auxiliary capacity wire 4 respectively.</p> |