发明名称 DIELECTRIC ELEMENT AND SEMICONDUCTOR STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To improve a residual polarization and to eliminate a film peeling at a dielectrics, by allowing the element ratio constituting lattice point occupied by at least two elements in a dielectrics to be different from the dielectrics center part at least near one electrode of the two electrodes. SOLUTION: On a first inter-layer insulating film 102 formed on a semiconductor substrate 101 where an active element is formed, a Pt is formed to form a lower part electrode 103. A dielectrics film 104, a dielectrics film 105, and a dielectrics film 106 are formed. A Pt film is formed to be an upper electrode 107. A silicon dioxide film is formed to be a second inter-layer insulating film 108, then an Al wiring layer 109 is formed, and after etching, a protective film 110 is formed. No lattice matching is sacrificed in a dielectrics device like this, resulting in elimination of film-peeling and constitution of a composition ratio excellent in polarizing characteristics at the center part of a dielectrics. Therefore, residual polarization Pr is improved.
申请公布号 JP2000031399(A) 申请公布日期 2000.01.28
申请号 JP19990162684 申请日期 1999.06.09
申请人 SEIKO EPSON CORP 发明人 HAGA YASUSHI
分类号 H01L21/8247;G11C11/22;H01L21/822;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L29/788;H01L29/792;(IPC1-7):H01L27/10;H01L21/824 主分类号 H01L21/8247
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