发明名称 SEMICONDUCTOR SUBSTRATE TREATING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor substrate treating device without watermarks which does not increase the number of processes and can suppress the steep rises in its device unit price and running cost. SOLUTION: In a semiconductor substrate treating device The surface of a substrate 3 to be treated with ultraviolet rays is irradiated from a plurality of ultraviolet lamps set up in the treating chamber 1 of a wet etching treatment system, while the substrate is wet-etched and rinsed with pure water. As a result, the wettability of the surface of the substrate 3 becomes hydrophilic, and the occurrence of watermarks is suppressed because the surface of the substrate 3 is activated.
申请公布号 JP2000031110(A) 申请公布日期 2000.01.28
申请号 JP19980194855 申请日期 1998.07.09
申请人 SEIKO EPSON CORP 发明人 KUWATA ATSUO
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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