发明名称 NONLINEAR VIBRATIONAL MICROSCOPY
摘要 <p>The present invention is a method and apparatus for microscopic vibrational imaging using coherent Anti-Stokes Raman Scattering or Sum Frequency Generation. The spatial resolution is attained by minimizing the spot size of the optical interrogation beams on the sample. Minimizing the spot size relies upon a) directing at least two substantially co-axial laser beams (interrogation beams) through a microscope objective providing a focal spot on the sample; b) collecting a signal beam together with a residual beam from the at least two co-axial laser beams after passing through the sample; c) removing the residual beam; and d) detecting the signal beam thereby creating said pixel. The method has significantly higher spatial resolution than IR microscopy and higher sensitivity than spontaneous Raman microscopy with much lower average excitation powers.</p>
申请公布号 WO2000004352(A1) 申请公布日期 2000.01.27
申请号 US1999016389 申请日期 1999.07.20
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