发明名称 METHOD FOR PATTERNING CAVITIES AND ENHANCED CAVITY SHAPES FOR SEMICONDUCTOR DEVICES
摘要 <p>A method of forming an opening within a surface of a semiconductor substrate while minimizing the effects of lithographic rounding. A semiconductor substrate is patterned using a first hard mask (152) with features aligned in a first direction and a second soft mask (164) with features aligned in a second direction.</p>
申请公布号 WO2000004571(A1) 申请公布日期 2000.01.27
申请号 US1999013443 申请日期 1999.06.16
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