发明名称 |
SEPARATING METHOD OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE: A separating method of semiconductor element is provided to electrically separate between elements CONSTITUTION: The separating method of semiconductor element comprises: a step sequentially forming a pad oxidation film and a nitride film on a silicon substrate; a step exposing the field area of the silicon substrate by etching the portion of the oxidation film and nitration film; a step forming a trench having prescribed depth by etching the exposed field area of the silicon substrate; a step forming a nitrate film having prescribed depth over all structure; a step depositing a thick oxidation film on the nitrate film to bury the trench; a step etching the oxidation film and nitration film until the nitration film is exposed; and a step removing the nitride film and the pad oxidation film under it.
|
申请公布号 |
KR20000004425(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025857 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, KEUN IL;JEON, YUN SUK;LIM, SUNG SOO |
分类号 |
H01L21/24;(IPC1-7):H01L21/24 |
主分类号 |
H01L21/24 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|