发明名称 POLISHING EQUIPMENT PROVIDED MATERIAL controlling SURFACE OF POLISHING PAD AND METHOD OF controlling SURFACE OF POLISHING PAD
摘要 PURPOSE: Polishing equipment is provided to improve the rate of operation in polishing a wafer. CONSTITUTION: In the polishing equipment, a polishing pad is fixed on top of a platen. The platen is rotated. A wafer and a wafer for controlling are supported by a carrier. The carrier is rotated. The carrier is went down on the top of the platen to polish the polishing pad. A dressing device is placed around the platen. A loading cup and a unloading cup are fixed on the path which the carrier is moving. A loader and a unloading unit is placed around the loading cup and unloading cup. The wafer for controlling is used to control the surface of the polishing pad.
申请公布号 KR20000006522(A) 申请公布日期 2000.01.25
申请号 KR19990024711 申请日期 1999.06.28
申请人 NEC CORPORATION 发明人 TORIKOJI
分类号 B24B37/00;B24B37/04;B24B53/007;B24B53/017;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B37/00
代理机构 代理人
主权项
地址