发明名称 THERMAL ASPERITY DETECTING METHOD OF A MAGNETIC RECORD DEVICE AND CIRCUIT THEREOF
摘要 PURPOSE: A thermal asperity detecting method and a detecting circuit are provided to detect whether a magnetic resistor element is contacted to a magnetic record medium. CONSTITUTION: The thermal asperity detecting method comprises the steps of: detecting an amplitude of an output of a magnetic resistor element to prepare a slice level of m times (m>1) of an output level; and comparing an output signal(RS) from the magnetic resistor element and the slice level(SL) to generate a thermal asperity detection signal(TAF), wherein the step of detecting further comprises eliminating a low frequency component of an output of the magnetic resistor element. Thereby, since a slice level is automatically prepared according to a characteristic of each magnetic resistor element, a thermal asperity of each magnetic resistor element can be detected accurately.
申请公布号 KR20000004891(A) 申请公布日期 2000.01.25
申请号 KR19980061678 申请日期 1998.12.30
申请人 FUJITSU LIMITED 发明人 TAKAHASI YASHIKO
分类号 G11B5/455;G11B5/00;G11B5/012;G11B5/02;G11B5/035;G11B5/09;G11B5/58;G11B19/04;G11B20/24;(IPC1-7):G11B5/58 主分类号 G11B5/455
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