发明名称 |
METHOD OF FABRICATING A STORAGE NODE FOR A STORAGE CAPACITOR |
摘要 |
PURPOSE: A storage node fabricating method is provided to reduce a variation on a pad SiN and to reduce a sensitive etching and recess process. CONSTITUTION: The storage node fabricating method comprises the steps of: etching a trench(11) on a surface of a semiconductor substrate(10); forming a dielectric layer(14) on sidewalls(12) of the trench; removing a part of the dielectric layer in order to expose a region below an upper part of the sidewall; growing an oxide layer on the upper part of the sidewall; removing a remnant part of the dielectric layer from the sidewall of the trench; forming a buried plate(17) by a doping; providing a node dielectric(18) to form a trench dielectric on a lower sidewall of the trench; and forming an internal electrode(19) in the trench.
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申请公布号 |
KR20000005724(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19990019343 |
申请日期 |
1999.05.28 |
申请人 |
INTERNATIONAL BUSINESS MACHINE CORPORATION;GEMANCE A.G |
发明人 |
ECONOMICOSRAERETIS;GRUENINGWOOLIKE;HOHERBERT L.;RADENS KAL J.;JAEMIRAGARAO;HOEFENERJOACHIM;SUNFUA |
分类号 |
H01L27/108;H01L21/8242;H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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