发明名称 METHOD OF FORMING SPUTTERING LAYER, EQUIPMENT FOR FORMING SPUTTERING LAYER AND FABRICATING METHOD OF EQUIPMENT
摘要 PURPOSE: Method of forming sputtering layer and equipment for forming sputtering layer and fabricating method of the equipment are provided to control a composition of a chemical compound easily. CONSTITUTION: The method of forming sputtering layer comprises the steps of: supplying alternating voltage or alternating current to all or part of the wall, which is placed external of space between a wafer and a target; generating a high frequency power to reduce electron temperature of plasma; including at least a kind of gas of helium, neon, xenon and krypton as sputter gas; supplying minus voltage to all or part of the wall, which is placed external of space between a wafer and a target.
申请公布号 KR20000005601(A) 申请公布日期 2000.01.25
申请号 KR19990006317 申请日期 1999.02.25
申请人 FUJITSU LIMITED 发明人 MIHARA SATTORU
分类号 H01L21/20;C23C14/08;C23C14/34;H01L21/203;H01L21/314;H01L21/316;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792;(IPC1-7):H01L21/20 主分类号 H01L21/20
代理机构 代理人
主权项
地址