发明名称 METHOD FOR FORMING AN ISOLATION LAYER OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: An isolation layer forming method is provided to minimize a bird's beak of the isolation layer and improve an yield. CONSTITUTION: The method comprises the steps of: forming a thermal oxide layer(2) on a silicon substrate(1) by dry oxidation process at high temperature; exposing an active region(4) of the silicon substrate(1) by selective etching the thermal oxide layer(2) using a photoresist pattern(3); selective growing a silicon epitaxial layer(5) on the exposed silicon substrate using reactive gas contained Cl, and simultaneous forming a polysilicon layer(6) on the thermal oxide layer(2); and removing the thermal oxide layer(2) and the polysilicon layer(6) by CMP.
申请公布号 KR20000004213(A) 申请公布日期 2000.01.25
申请号 KR19980025643 申请日期 1998.06.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, JONG MIN
分类号 H01L21/24;(IPC1-7):H01L21/24 主分类号 H01L21/24
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