发明名称 |
METHOD FOR FORMING AN ISOLATION LAYER OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: An isolation layer forming method is provided to minimize a bird's beak of the isolation layer and improve an yield. CONSTITUTION: The method comprises the steps of: forming a thermal oxide layer(2) on a silicon substrate(1) by dry oxidation process at high temperature; exposing an active region(4) of the silicon substrate(1) by selective etching the thermal oxide layer(2) using a photoresist pattern(3); selective growing a silicon epitaxial layer(5) on the exposed silicon substrate using reactive gas contained Cl, and simultaneous forming a polysilicon layer(6) on the thermal oxide layer(2); and removing the thermal oxide layer(2) and the polysilicon layer(6) by CMP.
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申请公布号 |
KR20000004213(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025643 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
LEE, JONG MIN |
分类号 |
H01L21/24;(IPC1-7):H01L21/24 |
主分类号 |
H01L21/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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