发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A forming method of capacitors is provided to enhance surface area of a storage electrode by forming a copper having selective depositing property on a lower electrode using MOCVD(metal organic CVD). CONSTITUTION: The method comprises the steps of: forming an interlayer dielectric(20) having contact holes on a semiconductor substrate(10) having transistors; forming a lower electrode(30) on the resultant structure; performing plasma treatment used nitrogen gas on the surface of the lower electrode(30) in order to enhance deposition rate of copper; and selective depositing a copper(40) having concave and convex on the lower electrode, thereby increasing the surface area of storage electrode.
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申请公布号 |
KR20000003645(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980024907 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, GEUN GOOK |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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