发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A forming method of capacitors is provided to enhance surface area of a storage electrode by forming a copper having selective depositing property on a lower electrode using MOCVD(metal organic CVD). CONSTITUTION: The method comprises the steps of: forming an interlayer dielectric(20) having contact holes on a semiconductor substrate(10) having transistors; forming a lower electrode(30) on the resultant structure; performing plasma treatment used nitrogen gas on the surface of the lower electrode(30) in order to enhance deposition rate of copper; and selective depositing a copper(40) having concave and convex on the lower electrode, thereby increasing the surface area of storage electrode.
申请公布号 KR20000003645(A) 申请公布日期 2000.01.25
申请号 KR19980024907 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KIM, GEUN GOOK
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
代理机构 代理人
主权项
地址