发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A fabrication method of capacitors is provided to prevent a bridge between capacitors and an oxidation of a lower electrode by forming an inner cylinder storage electrode having a slope. CONSTITUTION: The method comprises the steps of: forming an interlayer dielectric(21) having a first contact hole on a semiconductor substrate(20) having transistors; forming an insulating spacer(22) at both sidewalls of the first contact holes; depositing a first conductive layer(23) on the resultant structure to fill the contact hole; etching the conductive layer(23) using a mask(24); forming a sacrificial oxide(25) having a second contact hole to expose the center portion of the first conductive layer(23); forming a second conductive layer(27) on the resultant structure, wherein the second conductive layer(27) is formed by overhang on the upper part of the second contact hole; isolating the upper part of the second conductive layer(27) by CMP(chemical mechanical polishing) method; and removing the sacrificial oxide(25).
|
申请公布号 |
KR20000003644(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980024906 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
HOGN, GO RO;LEE, JEONG HO |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|