INSTRUMENT FOR MEASURING SEMICONDUCTOR RESISTANT DEVICE

摘要

PURPOSE: An instrument for measuring a semiconductor resistant device having a programmable current sink and a comparator is to apply a CFVM(current forcing voltage measure) method to test fast a semiconductor resistant device to a specified resistance value. CONSTITUTION: An instrument equips a sink sinking current by grounding the current applied via a second input terminal by a magnitude of reference voltage and a first voltage level value, and a comparator outputting a signal of a logic level to find the voltage applied within the range of a set voltage when applied with an input voltage via the second input terminal of the current sink. The instrument receives a reference voltage via the first input terminal and receives the first voltage produced by the current flowing in the resistant device under a test via the second input terminal connected to the resistant device.