发明名称 |
METHOD FOR FORMING AN INTERLAYER INSULATOR OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A forming method of an interlayer insulator is provided to a improve a uniformity of the interlayer insulator being not void without introducing the processes of high temperature and doping. CONSTITUTION: The interlayer insulator formation method comprises the steps of: forming a conduction line(21) on a predetermined lower layer(20); forming an MTO(medium temperature oxide) layer(22) on the entire surface of the resultant structure; partially etching the MTO layer(22) by an argon(Ar) sputtering method using a plasma contained inactive gases; and forming an interlayer insulator(23) made of BPSG(borophosphorous silicate glass).
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申请公布号 |
KR20000003909(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025216 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, JAE YOUNG;KIM, JUN DONG |
分类号 |
H01L21/312;(IPC1-7):H01L21/312 |
主分类号 |
H01L21/312 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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