发明名称 METHOD FOR FORMING AN INTERLAYER INSULATOR OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A forming method of an interlayer insulator is provided to a improve a uniformity of the interlayer insulator being not void without introducing the processes of high temperature and doping. CONSTITUTION: The interlayer insulator formation method comprises the steps of: forming a conduction line(21) on a predetermined lower layer(20); forming an MTO(medium temperature oxide) layer(22) on the entire surface of the resultant structure; partially etching the MTO layer(22) by an argon(Ar) sputtering method using a plasma contained inactive gases; and forming an interlayer insulator(23) made of BPSG(borophosphorous silicate glass).
申请公布号 KR20000003909(A) 申请公布日期 2000.01.25
申请号 KR19980025216 申请日期 1998.06.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KIM, JAE YOUNG;KIM, JUN DONG
分类号 H01L21/312;(IPC1-7):H01L21/312 主分类号 H01L21/312
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