发明名称 Process for manufacturing a sensor with a metal electrode in a metal oxide semiconductor (MOS) structure
摘要 The invention relates to a process for manufacturing a sensor with a metal electrode in an MOS structure. During the MOS process, a sensing region with a structure for the metal electrode is formed, this structure being made of a material having predetermined adhesion properties for metals, the sensing region being uncovered by etching the passivating layer, and a metallization of the surface of the MOS structure being carried out in which the metal layer adheres only to the structure for the metal electrode.
申请公布号 US6017775(A) 申请公布日期 2000.01.25
申请号 US19970948127 申请日期 1997.10.09
申请人 MICRONAS INTERMETALL GMBH 发明人 IGEL, GUENTER;GAHLE, HANS-JURGEN
分类号 H01L21/8234;G01N27/414;H01L27/088;(IPC1-7):H01L21/44 主分类号 H01L21/8234
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