发明名称 ISOLATING METHOD OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: An STI(shallow trench isolation) method of semiconductor devices is provided to prevent a short between metal and well due to a misalign of metal contact by using a trench being a width of lower part is more narrow than that of the upper part. CONSTITUTION: The STI method comprises the steps of forming a spacer(108) for device isolation on a semiconductor substrate(100); forming an ion-implanting plug(110) in the isolation region using the spacer(108) as an implantation mask; forming an STI region(112) by etching the exposed semiconductor substrate using the spacer(108) as a mask; removing the ion-implanting plug(110) by wet-etching, thereby the width of lower part of the STI region(112) is more narrow than that of the upper part; and depositing a trench oxide(114) to the STI region and flattening the trench oxide(114), thereby forming an STI layer.
申请公布号 KR20000004553(A) 申请公布日期 2000.01.25
申请号 KR19980025997 申请日期 1998.06.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 SHIM, HYUN WOONG;GU, BON SUNG
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/76
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