发明名称 |
ISOLATING METHOD OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: An STI(shallow trench isolation) method of semiconductor devices is provided to prevent a short between metal and well due to a misalign of metal contact by using a trench being a width of lower part is more narrow than that of the upper part. CONSTITUTION: The STI method comprises the steps of forming a spacer(108) for device isolation on a semiconductor substrate(100); forming an ion-implanting plug(110) in the isolation region using the spacer(108) as an implantation mask; forming an STI region(112) by etching the exposed semiconductor substrate using the spacer(108) as a mask; removing the ion-implanting plug(110) by wet-etching, thereby the width of lower part of the STI region(112) is more narrow than that of the upper part; and depositing a trench oxide(114) to the STI region and flattening the trench oxide(114), thereby forming an STI layer.
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申请公布号 |
KR20000004553(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025997 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
SHIM, HYUN WOONG;GU, BON SUNG |
分类号 |
H01L21/76;H01L21/762;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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