发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A fabrication method of semiconductor devices having different threshold voltage is provided to simplify manufacturing process and improve an yield by using an SPG(selective poly-silicon growing) without additional well processes. CONSTITUTION: The method comprises the steps of forming an isolation oxide(12) on a semiconductor substrate(10); forming an N-well(16) and a P-well(18) in the substrate; performing an N-channel ion implantation in a portion of the substrate; forming a sacrificial oxide(14) on the resultant structure; removing the sacrificial oxide(14) on the region to be form a device having different threshold voltage(Vt); forming an SPG layer(24) on the exposed substrate; removing the remained sacrificial oxide(14); forming a gate oxide(26) and a gate electrode(28); and forming NMOS transistors having a low and a high threshold voltage(Vt) and a PMOS transistor on the SPG layer(24) by ion-implanting.
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申请公布号 |
KR20000004539(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025983 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
CHO, KWANG HAENG |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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