发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES
摘要 PURPOSE: A fabrication method of semiconductor devices having different threshold voltage is provided to simplify manufacturing process and improve an yield by using an SPG(selective poly-silicon growing) without additional well processes. CONSTITUTION: The method comprises the steps of forming an isolation oxide(12) on a semiconductor substrate(10); forming an N-well(16) and a P-well(18) in the substrate; performing an N-channel ion implantation in a portion of the substrate; forming a sacrificial oxide(14) on the resultant structure; removing the sacrificial oxide(14) on the region to be form a device having different threshold voltage(Vt); forming an SPG layer(24) on the exposed substrate; removing the remained sacrificial oxide(14); forming a gate oxide(26) and a gate electrode(28); and forming NMOS transistors having a low and a high threshold voltage(Vt) and a PMOS transistor on the SPG layer(24) by ion-implanting.
申请公布号 KR20000004539(A) 申请公布日期 2000.01.25
申请号 KR19980025983 申请日期 1998.06.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 CHO, KWANG HAENG
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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