发明名称 |
SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A method of manufacturing a highly integrated semiconductor device having fine patterns is provided to reduce a parasitic capacitance among wiring and prevent insulation layer from exfoliating. CONSTITUTION: A method of manufacturing a semiconductor device comprises the steps of: preparing a semiconductor substrate; forming an insulation layer on the semiconductor substrate; forming a conductive layer for making wiring on the semiconductor substrate on which the insulation layer is formed; forming wiring disposed on patterns determined beforehand by patterning the conductive layer for making wiring; forming a layer for making a sidewall layer of wiring including fluorine-containing silicon oxide material on the semiconductor substrate to cover the wiring; forming sidewall layers of wiring including fluorine-containing silicon oxide material on side edge portions of wiring by etching back the layer to make sidewall layers of wiring; and forming an insulation layer among wiring including fluorine-containing silicon oxide material on the semiconductor substrate to cover the wiring and the sidewall layers of wiring. |
申请公布号 |
KR20000005788(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19990019952 |
申请日期 |
1999.06.01 |
申请人 |
NEC CORPORATION |
发明人 |
ODA, NORIAKKI |
分类号 |
H01L21/316;H01L21/768;H01L23/12;H01L23/522;H01L23/532;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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