发明名称 SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A method of manufacturing a highly integrated semiconductor device having fine patterns is provided to reduce a parasitic capacitance among wiring and prevent insulation layer from exfoliating. CONSTITUTION: A method of manufacturing a semiconductor device comprises the steps of: preparing a semiconductor substrate; forming an insulation layer on the semiconductor substrate; forming a conductive layer for making wiring on the semiconductor substrate on which the insulation layer is formed; forming wiring disposed on patterns determined beforehand by patterning the conductive layer for making wiring; forming a layer for making a sidewall layer of wiring including fluorine-containing silicon oxide material on the semiconductor substrate to cover the wiring; forming sidewall layers of wiring including fluorine-containing silicon oxide material on side edge portions of wiring by etching back the layer to make sidewall layers of wiring; and forming an insulation layer among wiring including fluorine-containing silicon oxide material on the semiconductor substrate to cover the wiring and the sidewall layers of wiring.
申请公布号 KR20000005788(A) 申请公布日期 2000.01.25
申请号 KR19990019952 申请日期 1999.06.01
申请人 NEC CORPORATION 发明人 ODA, NORIAKKI
分类号 H01L21/316;H01L21/768;H01L23/12;H01L23/522;H01L23/532;(IPC1-7):H01L21/768 主分类号 H01L21/316
代理机构 代理人
主权项
地址