| 摘要 |
PURPOSE: Carrier board for testing IC device is provided to overcome the problem that the performance of floating is dropped when spring force of floating spring is enlarged. CONSTITUTION: The carrier board for testing IC device comprises carrier board, electrode of IC device loaded on the carrier without damaging floating ability of the carrier, base wall, clamp lever, floating spring positioning between the carrier and board body, contact block, supporting plate positioning on the lower place of the carrier, four guide rods connecting the supporting plate and the carrier, and compression spring compressed between the carrier and the supporting plate.
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