发明名称 |
TRENCH CAPACITOR STRUCTURE AND FABRICATION METHOD THEREOF |
摘要 |
PURPOSE: The trench capacitor structure and a fabrication method are provided to reduce a divided serial resistance of a deep trench electrode and a serial capacitance thereof. CONSTITUTION: The trench capacitor fabrication method comprises: a first step of providing a semiconductor substrate(12) which has a trench(16) of a narrow upper region(16a) and a wide lower region(16b), an electrode surrounding the wide lower region(16b), and a node dielectric lining the trench of a part at which the electrode is disposed; a second step of filling the trench(16) with a polysilicon layer having a void in the wide lower region of the trench; a third step of making the structure from the second step be flat; a fourth step of removing the polysilicon layer in the narrow upper region(16a) to expose the void(26) in the wide lower region(16b); a fifth step of forming a refractory metal layer(30) in the narrow upper region(16a) and the wide lower region(16b); a sixth step of annealing the resultant structure to a refractory metal salicide layer(32) in the wide lower region; and a seventh step of removing the refractory metal layer in the narrow upper region and filling the trench structure with a polysilicon.
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申请公布号 |
KR20000006315(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19990023200 |
申请日期 |
1999.06.21 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION.;SIEMENS AKTIENGESELLSCHAFT |
发明人 |
JAMBINOJEFRIPI;GRUENINGWOOLIK;MANDELMANJACK A.;RADENSCAL J. |
分类号 |
H01L27/108;H01L21/8242;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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