发明名称 |
METHOD FOR FORMING A CONTACT HOLE OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A forming method of contact hole is provided to improve an insulating property between a bit line, a conductive pad for storage node and a gate electrode. CONSTITUTION: The method comprises the steps of: forming a first insulating layer on a semiconductor substrate(100) having gate electrode patterns(142); forming an interlayer dielectric(154) on the first insulating layer; forming contact holes(156) between the gate electrode patterns by etching the interlayer dielectric(154); forming a second insulating layer on the resultant structure; forming a spacer(160) at both sidewalls of the contact hole(156) by etch-back the second insulating layer; and etching the first insulating layer using the spacer(160) and the interlayer dielectric(154) as a mask to expose the semiconductor substrate(100).
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申请公布号 |
KR20000003872(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025172 |
申请日期 |
1998.06.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHANG, SOON GYU |
分类号 |
H01L21/8242;H01L21/02;H01L21/28;H01L21/311;H01L21/768;H01L27/108;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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