发明名称 METHOD FOR FORMING A CONTACT HOLE OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A forming method of contact hole is provided to improve an insulating property between a bit line, a conductive pad for storage node and a gate electrode. CONSTITUTION: The method comprises the steps of: forming a first insulating layer on a semiconductor substrate(100) having gate electrode patterns(142); forming an interlayer dielectric(154) on the first insulating layer; forming contact holes(156) between the gate electrode patterns by etching the interlayer dielectric(154); forming a second insulating layer on the resultant structure; forming a spacer(160) at both sidewalls of the contact hole(156) by etch-back the second insulating layer; and etching the first insulating layer using the spacer(160) and the interlayer dielectric(154) as a mask to expose the semiconductor substrate(100).
申请公布号 KR20000003872(A) 申请公布日期 2000.01.25
申请号 KR19980025172 申请日期 1998.06.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHANG, SOON GYU
分类号 H01L21/8242;H01L21/02;H01L21/28;H01L21/311;H01L21/768;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/8242
代理机构 代理人
主权项
地址