发明名称 |
SEMICONDUCTOR FUSE FORMATION METHOD |
摘要 |
PURPOSE: A semiconductor fuse formation method is provided to prevent the crack of dielectric substance and the damage of neighboring fuse due to the crush of a fuse CONSTITUTION: The semiconductor fuse formation method comprises: a step forming a fuse(12) and an active element(14) on different areas of a semiconductor substrate(10); a step forming dielectric layers(32,34) on the fuse and active element; a step forming via holes(44) for exposing the contact area of the fuse and active element and passing through a selected area of the dielectric layer; a step depositing conductive substance(46a,46b,46c) on the fuse and the exposed area through upper part of the dielectric layer and via holes; and a step removing conductive substance deposited on the fuse with remaining conductive substance deposited on the contact area of the active element. |
申请公布号 |
KR20000006377(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19990023670 |
申请日期 |
1999.06.23 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
TOPBEN DIRC;WEBUR STEPENJEI;BRINTJINGER AXCEL |
分类号 |
H01L21/768;H01L21/82;H01L23/525;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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