发明名称 SEMICONDUCTOR FUSE FORMATION METHOD
摘要 PURPOSE: A semiconductor fuse formation method is provided to prevent the crack of dielectric substance and the damage of neighboring fuse due to the crush of a fuse CONSTITUTION: The semiconductor fuse formation method comprises: a step forming a fuse(12) and an active element(14) on different areas of a semiconductor substrate(10); a step forming dielectric layers(32,34) on the fuse and active element; a step forming via holes(44) for exposing the contact area of the fuse and active element and passing through a selected area of the dielectric layer; a step depositing conductive substance(46a,46b,46c) on the fuse and the exposed area through upper part of the dielectric layer and via holes; and a step removing conductive substance deposited on the fuse with remaining conductive substance deposited on the contact area of the active element.
申请公布号 KR20000006377(A) 申请公布日期 2000.01.25
申请号 KR19990023670 申请日期 1999.06.23
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 TOPBEN DIRC;WEBUR STEPENJEI;BRINTJINGER AXCEL
分类号 H01L21/768;H01L21/82;H01L23/525;(IPC1-7):H01L21/82 主分类号 H01L21/768
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