发明名称 |
METHOD FOR FORMING A CAPACITOR OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A capacitor formation method is provided to simplify manufacturing process without sophisticated processes by enhancing an area of a storage electrode using TiN layer instead of HSG(hemi-spherical grain). CONSTITUTION: The method comprises the steps of: forming an interlayer dielectric(20) having contact holes on a semiconductor substrate(10) having transistors; forming a storage electrode(21) to fill a polysilicon layer into the contact holes; forming a TiN layer(22) having a high roughness on the resultant structure using sputtering having high pressure and high N2 flow rate; and removing the TiN layer(22), so that the surface area of the storage electrode is increased.
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申请公布号 |
KR20000004410(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025842 |
申请日期 |
1998.06.30 |
申请人 |
HYUNAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, YOUNG GI;EU, JAE DOO |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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