发明名称 METHOD FOR FORMING A CAPACITOR OF SEMICONDUCTOR DEVICES
摘要 PURPOSE: A capacitor formation method is provided to simplify manufacturing process without sophisticated processes by enhancing an area of a storage electrode using TiN layer instead of HSG(hemi-spherical grain). CONSTITUTION: The method comprises the steps of: forming an interlayer dielectric(20) having contact holes on a semiconductor substrate(10) having transistors; forming a storage electrode(21) to fill a polysilicon layer into the contact holes; forming a TiN layer(22) having a high roughness on the resultant structure using sputtering having high pressure and high N2 flow rate; and removing the TiN layer(22), so that the surface area of the storage electrode is increased.
申请公布号 KR20000004410(A) 申请公布日期 2000.01.25
申请号 KR19980025842 申请日期 1998.06.30
申请人 HYUNAI ELECTRONICS IND. CO., LTD. 发明人 KIM, YOUNG GI;EU, JAE DOO
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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