发明名称 CAPACITOR PREPARATION METHOD OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE: A capacitor preparation method of semiconductor element is provided to remove contaminant on a silicon which a HSG thin film is formed on and form the HSG thin film having uniform surface area. CONSTITUTION: The capacitor preparation method of semiconductor element comprises: a step forming amorphous silicon films(12,23) doped as storage electrode substance on semiconductor substrates(10,20); a step etching the doped amorphous silicon films into prescribed storage electrode shape; a step removing contaminant on the doped amorphous silicon films by treating the surface of the etched doped amorphous silicon films by using O2 plasma; and a step forming storage electrodes(100,200) by forming a hemisphere shape grain polysilicon thin film on the surface of the doped amorphous silicon films.
申请公布号 KR20000004402(A) 申请公布日期 2000.01.25
申请号 KR19980025834 申请日期 1998.06.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 OH, HOON JUNG;KIM, HAE WON;KIM, JAE YOUNG
分类号 H01L29/92;(IPC1-7):H01L29/92 主分类号 H01L29/92
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