发明名称 |
CAPACITOR PREPARATION METHOD OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE: A capacitor preparation method of semiconductor element is provided to remove contaminant on a silicon which a HSG thin film is formed on and form the HSG thin film having uniform surface area. CONSTITUTION: The capacitor preparation method of semiconductor element comprises: a step forming amorphous silicon films(12,23) doped as storage electrode substance on semiconductor substrates(10,20); a step etching the doped amorphous silicon films into prescribed storage electrode shape; a step removing contaminant on the doped amorphous silicon films by treating the surface of the etched doped amorphous silicon films by using O2 plasma; and a step forming storage electrodes(100,200) by forming a hemisphere shape grain polysilicon thin film on the surface of the doped amorphous silicon films.
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申请公布号 |
KR20000004402(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025834 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
OH, HOON JUNG;KIM, HAE WON;KIM, JAE YOUNG |
分类号 |
H01L29/92;(IPC1-7):H01L29/92 |
主分类号 |
H01L29/92 |
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