发明名称 METHOD FOR FORMING CONTACT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A contact method of semiconductor device is provide to contact a lower electrode of polyside structure and a upper electrode of polyside structure through a contact hole. CONSTITUTION: The method comprises the steps of: forming a lower electrode(23) of polyside structure on a semiconductor substrate(21); forming an interlayer insulating film(25) on the whole structure having the lower electrode and then forming a contact hole for exposing a portion of the lower electrode; injecting silicon atoms into a surface of the lower electrode exposed through the contact hole; and forming an upper electrode(26) connected to the lower electrode through the contact hole. Thereby, it is possible to reduce a contact resistance by ohmic contacting the lower electrode and the upper electrode and enhance a signal processing speed.
申请公布号 KR20000004220(A) 申请公布日期 2000.01.25
申请号 KR19980025650 申请日期 1998.06.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 JUNG, YEONG SEOK;HONG, BYEONG SEOP
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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