发明名称 |
METHOD FOR FORMING CONTACT OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A contact method of semiconductor device is provide to contact a lower electrode of polyside structure and a upper electrode of polyside structure through a contact hole. CONSTITUTION: The method comprises the steps of: forming a lower electrode(23) of polyside structure on a semiconductor substrate(21); forming an interlayer insulating film(25) on the whole structure having the lower electrode and then forming a contact hole for exposing a portion of the lower electrode; injecting silicon atoms into a surface of the lower electrode exposed through the contact hole; and forming an upper electrode(26) connected to the lower electrode through the contact hole. Thereby, it is possible to reduce a contact resistance by ohmic contacting the lower electrode and the upper electrode and enhance a signal processing speed.
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申请公布号 |
KR20000004220(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025650 |
申请日期 |
1998.06.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
JUNG, YEONG SEOK;HONG, BYEONG SEOP |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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