| 摘要 |
PURPOSE: The tester is to achieve uniformity of pressure applied to the contact of IC under testing. CONSTITUTION: The IC tester(1) having a pusher base (34) movable to and from a contact pin(51), a pusher block(36) applying tensile force to the push block(31) in the direction of pressure application to the test IC carries out a test for an IC with its input /output terminal being pushed onto a test head contact pin(51).
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