发明名称 MANUFACTURE OF STACK-LIKE CAPACITOR FOR DRAM
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a stack-like capacitor which is used for a DRAM and large in surface area. SOLUTION: When a capacitor composed of an upper electrode 16, a dielectric layer 13, and a lower electrode 15 is manufactured, a lower electrode base 10a is previously cleaned with an acid solution to remove a natural oxide film from its surface, a first amorphous silicon layer 11 is deposited, and a second amorphous silicon layer is deposited on the first amorphous silicon layer 11 and turned by seeding/annealing into a silicon layer 12b where hemispherical grains(HSG) protrude from its surface, whereby the surface of the lower electrode 15 can be enlarged in area.
申请公布号 JP2000022098(A) 申请公布日期 2000.01.21
申请号 JP19980252731 申请日期 1998.09.07
申请人 VANGUARD INTERNATL SEMICONDUCTOR CORP 发明人 RIN DAISEI;CHO EIWA;CHIN SHAKUSEN;SO KOKUSHO
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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