发明名称 METHOD FOR EXCHANGING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for exchanging a semiconductor device, wherein a satisfactory wiring pad surface is provided at re-connection without breaking a circuit substrate or peripheral part, at removal of the semiconductor device. SOLUTION: A part of a mounting structure which is between the upper surface of a semiconductor device on a circuit board 7 and at least to its lower surface height is removed, using a drill 6 for flattening its surface. Then, a metal plate 5 where a solder 9 is formed on its surface is made to hit a bump electrode 1 under heated condition. Then the metal plate 5 is detached after the temperature is lowered. Thus, the bump electrode 1 present in a sealing resin 8 is removed, while the sealing resin 8 left.
申请公布号 JP2000021936(A) 申请公布日期 2000.01.21
申请号 JP19980183461 申请日期 1998.06.30
申请人 SHARP CORP 发明人 OKANO TETSUYUKI
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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