发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To variably set timing of a write command read time (tRWL) for a RAS bar signal shorter than a specified value and a precharging time (tRP) to be desirably measured by executing operation tests at the tRWL for a RAS bar signal shorter than a specified value and the tRP. SOLUTION: When a RAS bar is set to 'L' (active), an internal RAS bar of an output end (a) becomes active, and a potential of a word line is raised to 'H'. Thereafter, a WE bar signal is set to 'L', and a write operation is started (timing t1). After the WE bar is input, the RAS bar is reset via a Delay 1 to 'H' (timing t2). Thus, the potential of the word line is lowered to the 'L', and writing in the memory cell is ended. Thereafter, an external RAS bar is set to the 'H', and reset (timing t3). A tRWL observed at an external signal is (t3-t2), but in a substantial operation, the tRWL becomes (t2-t1) according to the internal RAS bar signal.
申请公布号 JP2000021197(A) 申请公布日期 2000.01.21
申请号 JP19980183885 申请日期 1998.06.30
申请人 NEC CORP 发明人 KOSHIDA HAJIME
分类号 G01R31/28;G11C11/401;G11C11/407;G11C29/00;G11C29/50;(IPC1-7):G11C29/00 主分类号 G01R31/28
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