发明名称 PREPARING METHOD OF MASK PATTERN AND PHOTOMASK
摘要 PROBLEM TO BE SOLVED: To prepare desired transfer patterns with high accuracy while suppressing the explosive increase of the amount of data. SOLUTION: This preparing method of a mask pattern used for forming desired patterns on an exposed substrate by means of an exposure device, includes a process for making a correction of design data with respect to a first element for which the quantity of correction is determined depending on the disposition of patterns with sizes ranging below a predetermined one, a process for converting the corrected design data into mask plotting data, and a process for making a correction with respect to a second element other than the first element when the mask plotting data are introduced into a plotting device for performing plotting.
申请公布号 JP2000019708(A) 申请公布日期 2000.01.21
申请号 JP19980182431 申请日期 1998.06.29
申请人 TOSHIBA CORP 发明人 TANAKA SATOSHI;KOTANI TOSHIYA;INOUE SOICHI
分类号 G03F1/36;G03F1/68;H01L21/027 主分类号 G03F1/36
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