发明名称 ELECTRONIC CIRCUIT DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To obtain a semiconductor device that has high bonding strength between a circuit substrate and an IC, and high reliability in terms of environmental resistance. SOLUTION: A pattern 3 for reinforcing bonding is arranged adjacent to the terminal for IC connection of a circuit substrate where a pattern 2 is formed on an insulating substrate 1 of a polyimide film or the like, and an the adhesion force between an IC 4 and the circuit substrate is increased, thus improving reliability against change in temperature. Also, the reliability due to moisture resistance is improved for a substrate with high moisture permeability such as polyimide.</p>
申请公布号 JP2000022286(A) 申请公布日期 2000.01.21
申请号 JP19980185058 申请日期 1998.06.30
申请人 SEIKO INSTRUMENTS INC 发明人 MATSUDAIRA TSUTOMU;ENDO ATSUSHI
分类号 H05K1/18;H01L21/56;H01L21/60;H05K1/02;(IPC1-7):H05K1/02 主分类号 H05K1/18
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