发明名称 METHOD FOR WRITING TO NONVOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To restrict a spread of a threshold value distribution by writing to a memory cell sequentially from a write state of a large difference of a quantity of electric charges in a floating gate to an erase state. SOLUTION: Memory cells M are arranged in rows and columns to form arrays, and a plurality of row lines (WL0-WLn) for connecting control gates of memory cells M constituting the rows and seven column lines (BL0-BL6) for connecting in common drains and sources of memory cells M constituting the columns are set in the memory. In programming to the memory, a quantity of electric charges of each floating gate is changed thereby providing one memory cell M with a plurality of memory states, so that four values of memory states '11', '10', '01' and '00' can be stored. Writing to the memory is carried out sequentially from a write state of a large difference of the quantity of electric charges in the floating gate to an erase state (data '00').</p>
申请公布号 JP2000021185(A) 申请公布日期 2000.01.21
申请号 JP19980184015 申请日期 1998.06.30
申请人 SHARP CORP 发明人 HIRANO YASUAKI;OOTA YOSHIJI
分类号 G11C16/04;G11C11/56;G11C16/02;G11C16/10;(IPC1-7):G11C16/04 主分类号 G11C16/04
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