发明名称 MANUFACTURING FOR SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a manufacturing method for a semiconductor device having a semiconductor layer with high field-effect mobility. SOLUTION: In a manufacturing method, a polysilicon film 3 is formed on a transparent insulating substrate 1, and the surface of the polysilicon film 4 is oxidized to form a thick silicon dioxide film 4. After the silicon dioxide film 4 is removed, the uneven surface of the polysilicon film 3 is polished and flattened by a CMP(chemical-mechanical polishing) method, and the surface of the polysilicon film 3 is oxidized again to form a thin silicon dioxide film 4a. After that, the silicon dioxide film 4a is removed. Then, the polysilicon film 3 obtained has a flat face and extremely satisfactory characteristics in crystallinity. As a result, field-effect mobility in a TFT(thin-film transistor) with the polysilicon film 3 as an active layer can be made to improve.</p>
申请公布号 JP2000022159(A) 申请公布日期 2000.01.21
申请号 JP19980187642 申请日期 1998.07.02
申请人 SANYO ELECTRIC CO LTD 发明人 ABE HISASHI;HAMADA HIROYOSHI
分类号 G02F1/136;G02F1/1368;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/136
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