发明名称 METHOD AND SYSTEM FOR DRY ETCHING
摘要 PROBLEM TO BE SOLVED: To attain a high etching rate without using halogen gases, such as chlorine in using plasma etching. SOLUTION: Plasma is generated in a vacuum vessel 1 by supplying a gas from a gas inlet 14 into the vacuum vessel 1 while evacuating the gas from the vacuum vessel 1 with a vacuum pump 11. When the etching object of a substrate 7 which is mounted on an electrode 6 in the vacuum vessel 1 is etched, a mixed gas containing oxygen gas and carbon or containing hydrogen atoms and carbon atoms is supplied. Thereby, etching objects such as ruthenium, ruthenium oxide, iridium, iridium oxide, rhenium, rhenium oxide, rhodium or rhodium oxide are etched at a high etching rate.
申请公布号 JP2000021859(A) 申请公布日期 2000.01.21
申请号 JP19980188421 申请日期 1998.07.03
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KAI TAKAYUKI
分类号 C23F4/00;H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 C23F4/00
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