发明名称 METHOD OF FORMING SINGLE CRYSTAL SILICON LAYER AND MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To uniformly epitaxially grow an Si layer at low temps. by epitaxially growing a polysilicon or amorphous Si layer or Si of a low-m.t. metal layer with seeds of steps to precipitate a single crystal Si layer by the cooling treatment. SOLUTION: On one main surface of a quartz glass substrate 1 a photoresist 2 is formed in a specified pattern, e.g. and irradiated with F+ ions 3 of a CF4 plasma with this resist 2 used as a mask to form a plurality of steps 4 on the substrate 1 by the reactive ion etching(RIE), then the photo resist is removed, a polysilicon film 5 is deposited on the entire surface including the steps 4, and the polysilicon film 5 is dissolved in a melt of the metal In 6 and gradually cooled to epitaxially grow the Si dissolved in the metal In with the steps used as seeds, thus precipitating a single crystal Si layer 7.
申请公布号 JP2000021791(A) 申请公布日期 2000.01.21
申请号 JP19980184462 申请日期 1998.06.30
申请人 SONY CORP 发明人 YAMOTO HISAYOSHI;YAMANAKA HIDEO;SATO YUICHI;YAGI HAJIME
分类号 H01L21/20;H01L21/208;H01L21/336;H01L29/786;(IPC1-7):H01L21/208 主分类号 H01L21/20
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