发明名称 |
Gerät zum Ermitteln oder Beurteilen von abnormalen Mustern, zum Beurteilen von kreisförmigen Mustern und Bildermittlungsgerät |
摘要 |
An abnormal pattern detecting apparatus comprises a device for finding prospective abnormal patterns in a radiation image of an object from an image signal representing the radiation image, and a device for finding anatomical information about the object from the image signal. From the image signal components of the image signal, which represent the image information at positoins in the vicinity of each prospective abnormal pattern, a characteristic measure calculating device calculates a plurality of characteristic measures for each prospective abnormal pattern. An abnormal pattern finding device utilizes the characteristic measures and the anatomical information in order to find a true abnormal pattern from the prospective abnormal patterns. |
申请公布号 |
DE69033394(D1) |
申请公布日期 |
2000.01.20 |
申请号 |
DE1990633394 |
申请日期 |
1990.06.26 |
申请人 |
FUJI PHOTO FILM CO., LTD. |
发明人 |
SHIMURA, KAZUO;ADACHI, YUUMA;HARA, SHOJI;NAKAJIMA, NOBUYOSHI;ITO, WATARU |
分类号 |
G06F19/00;G06K9/46;G06T5/00;G06T7/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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