发明名称 |
Method for forming a photomask |
摘要 |
A fabrication process for a multi-layer photomask. A transparent substrate is provided. An anti-reflecting layer is formed on the substrate. First blinding blocks are formed on the anti-reflecting layer by defining a first blinding layer. A transparent layer is formed along the profile of the structure surface described above. Second blinding blocks are formed on the transparent layer between the first blinding blocks by defining a second blinding layer, wherein a part of the transparent layer on the first blocks is exposed.
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申请公布号 |
US6015642(A) |
申请公布日期 |
2000.01.18 |
申请号 |
US19980197271 |
申请日期 |
1998.11.20 |
申请人 |
UNITED MICROELETRONICS CORP. |
发明人 |
LIN, BENJAMIN SZU-MIN |
分类号 |
G03F1/14;(IPC1-7):G03F9/00 |
主分类号 |
G03F1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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