发明名称 Method for forming a photomask
摘要 A fabrication process for a multi-layer photomask. A transparent substrate is provided. An anti-reflecting layer is formed on the substrate. First blinding blocks are formed on the anti-reflecting layer by defining a first blinding layer. A transparent layer is formed along the profile of the structure surface described above. Second blinding blocks are formed on the transparent layer between the first blinding blocks by defining a second blinding layer, wherein a part of the transparent layer on the first blocks is exposed.
申请公布号 US6015642(A) 申请公布日期 2000.01.18
申请号 US19980197271 申请日期 1998.11.20
申请人 UNITED MICROELETRONICS CORP. 发明人 LIN, BENJAMIN SZU-MIN
分类号 G03F1/14;(IPC1-7):G03F9/00 主分类号 G03F1/14
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