发明名称 Failure analysis method and device
摘要 A method comprises steps of: forming a FBM (step S1); generating a second failure map by compressing data of the FBM (step S2); recognizing a failure mode from the second failure map (step S3); selecting a specific failure mode (step S4); and analyzing the specific failure mode by using a part of the corresponding FBM (step S5). This makes a detail analysis possible while suppressing the number of processing data, and thereby achieves a failure analysis method and device improving accuracy and reliability in comparison result.
申请公布号 US6016278(A) 申请公布日期 2000.01.18
申请号 US19980055905 申请日期 1998.04.07
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION 发明人 TSUTSUI, TOSHIKAZU;FURUTA, MASAAKI
分类号 G01B11/30;G01N21/88;G01R31/28;G11C29/44;H01L21/66;(IPC1-7):G11C7/00 主分类号 G01B11/30
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