发明名称 Plasma CVD method
摘要 In a process of forming a silicon oxide film 116 that constitutes an interlayer insulating film with TEOS as a raw material through the plasma CVD method, the RF output is oscillated at 50 W, and the RF output is gradually increased from 50 W to 250 W (an output value at the time of forming a film) after discharging (after the generation of O2-plasma). A TEOS gas is supplied to start the film formation simultaneously when the RF output becomes 250 W, or while the timing is shifted. As a result, because the RF power supply is oscillated at a low output when starting discharging, a voltage between the RF electrodes can be prevented from changing transitionally and largely.
申请公布号 US6015762(A) 申请公布日期 2000.01.18
申请号 US19960748233 申请日期 1996.11.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI, SHUNPEI;SAKAMA, MITSUNORI;HIROKI, MASAAKI
分类号 C23C16/50;C23C16/40;H01L21/205;H01L21/285;H01L21/31;H01L21/316;H01L29/786;(IPC1-7):H01L21/02 主分类号 C23C16/50
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