发明名称 |
METHOD OF FORMING CHARGE STORAGE ELECTRODE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: The method is for increasing capacitance of a capacitor and for improving the characteristics and the reliability of a semiconductor device. CONSTITUTION: The method makes the patterning of a thick polycrystalline silicon layer(15) easy by etching the polycrystalline silicon layer using a silicon oxide film(17) as a mask when using a thick polycrystalline silicon layer to increase the surface area of a charge storage electrode.
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申请公布号 |
KR20000003625(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024885 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
PARK, BYUNG JUN;KIM, JIN WOONG |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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