发明名称 METHOD OF FORMING CHARGE STORAGE ELECTRODE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: The method is for increasing capacitance of a capacitor and for improving the characteristics and the reliability of a semiconductor device. CONSTITUTION: The method makes the patterning of a thick polycrystalline silicon layer(15) easy by etching the polycrystalline silicon layer using a silicon oxide film(17) as a mask when using a thick polycrystalline silicon layer to increase the surface area of a charge storage electrode.
申请公布号 KR20000003625(A) 申请公布日期 2000.01.15
申请号 KR19980024885 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 PARK, BYUNG JUN;KIM, JIN WOONG
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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