发明名称 MOSFET MANUFACTURING METHOD HAVING POLYCIDE GATE
摘要 PURPOSE: A MOSFET manufacturing method is provided to easily inject the LDD ion by preventing an abnormal oxidized film from generating on the side wall of a polycide gate applying a titanium silicide. CONSTITUTION: The MOSFET manufacturing method having the polycide gate that applies titanium silicide, has the steps of: sequentially layering a polysilicon film(3) and a titanium(4) on a gate insulating film; rapidly heating for forming a titanium silicide film(5) in a nitric atmosphere; and removing the titanium nitric film that is additionally generated on the titanium silicide film.
申请公布号 KR20000003411(A) 申请公布日期 2000.01.15
申请号 KR19980024653 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 JANG, SE UK;KIM, TAE GYOON
分类号 H01L21/336;H01L21/28;H01L21/3213;(IPC1-7):H01L21/336 主分类号 H01L21/336
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