发明名称 |
MOSFET MANUFACTURING METHOD HAVING POLYCIDE GATE |
摘要 |
PURPOSE: A MOSFET manufacturing method is provided to easily inject the LDD ion by preventing an abnormal oxidized film from generating on the side wall of a polycide gate applying a titanium silicide. CONSTITUTION: The MOSFET manufacturing method having the polycide gate that applies titanium silicide, has the steps of: sequentially layering a polysilicon film(3) and a titanium(4) on a gate insulating film; rapidly heating for forming a titanium silicide film(5) in a nitric atmosphere; and removing the titanium nitric film that is additionally generated on the titanium silicide film.
|
申请公布号 |
KR20000003411(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024653 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
JANG, SE UK;KIM, TAE GYOON |
分类号 |
H01L21/336;H01L21/28;H01L21/3213;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|