发明名称 |
METHOD FOR FORMING CONNECT WIRE OF C-METAL OXIDE SEMICONDUCTOR TRANSISTOR USING POLY-SILICON FILM |
摘要 |
PURPOSE: A method for forming a connect wire of a C-Metal Oxide Semiconductor(CMOS) transistor using a poly-silicon film is provided to prevent impurities from diffusing from an impurity area forming a drain of each transistor to the connect wire. CONSTITUTION: A method for forming a connecting wiring of a CMOS transistor comprises: a first step forming an NMOS transistor and a PMOS transistor on a semiconductor substrate; a second step forming an interlayer insulating film on the whole structure and selectively eliminating the interlayer insulating film for forming a contact hole; a third step forming an impurity diffusion preventing film in the contact hole; and a fourth step forming a poly-silicon film connecting wiring for connecting the drain areas of the NMOS transistor and the PMOS transistor.
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申请公布号 |
KR20000002718(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980023612 |
申请日期 |
1998.06.23 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
KIM, JIN HA;NAM, JONG WAN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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主权项 |
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地址 |
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