发明名称 METHOD FOR FORMING CONNECT WIRE OF C-METAL OXIDE SEMICONDUCTOR TRANSISTOR USING POLY-SILICON FILM
摘要 PURPOSE: A method for forming a connect wire of a C-Metal Oxide Semiconductor(CMOS) transistor using a poly-silicon film is provided to prevent impurities from diffusing from an impurity area forming a drain of each transistor to the connect wire. CONSTITUTION: A method for forming a connecting wiring of a CMOS transistor comprises: a first step forming an NMOS transistor and a PMOS transistor on a semiconductor substrate; a second step forming an interlayer insulating film on the whole structure and selectively eliminating the interlayer insulating film for forming a contact hole; a third step forming an impurity diffusion preventing film in the contact hole; and a fourth step forming a poly-silicon film connecting wiring for connecting the drain areas of the NMOS transistor and the PMOS transistor.
申请公布号 KR20000002718(A) 申请公布日期 2000.01.15
申请号 KR19980023612 申请日期 1998.06.23
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 KIM, JIN HA;NAM, JONG WAN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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