发明名称 |
SEMICONDUCTOR DEVICE AND METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and method thereof are provided to decrease a resistance of a gate by forming the gate having multi-layer. CONSTITUTION: The method comprises the steps of: forming a first insulating layer(32a) by thermal oxidation and a first conductive layer(33); forming a trench by selective etching the first conductive layer(33); forming a second conductive layer(35) and an HLD(High temperature Low Deposition) layer(36a) on the first conductive layer; forming a cap gate insulator(36) by selective etching the HLD layer(36a); and forming multi-layer gate(38) by selective etching the second conductive layer(35), the first conductive layer(33) and the first insulating layer(32a) using the cap gate insulator(36).
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申请公布号 |
KR20000001660(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980022022 |
申请日期 |
1998.06.12 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
LEE, YONG GEUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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