发明名称 SEMICONDUCTOR DEVICE AND METHOD THEREOF
摘要 PURPOSE: A semiconductor device and method thereof are provided to decrease a resistance of a gate by forming the gate having multi-layer. CONSTITUTION: The method comprises the steps of: forming a first insulating layer(32a) by thermal oxidation and a first conductive layer(33); forming a trench by selective etching the first conductive layer(33); forming a second conductive layer(35) and an HLD(High temperature Low Deposition) layer(36a) on the first conductive layer; forming a cap gate insulator(36) by selective etching the HLD layer(36a); and forming multi-layer gate(38) by selective etching the second conductive layer(35), the first conductive layer(33) and the first insulating layer(32a) using the cap gate insulator(36).
申请公布号 KR20000001660(A) 申请公布日期 2000.01.15
申请号 KR19980022022 申请日期 1998.06.12
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 LEE, YONG GEUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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