发明名称 |
METHOD OF FORMING CAPACITOR HAVING BOTTOM ELECTRODE OF DOUBLE FILM STRUCTURE OF IRIDIUM FILM AND PLATINUM FILM |
摘要 |
PURPOSE: The method improves the characteristics of preventing the oxygen diffusion and prevents the increase of leakage current. CONSTITUTION: The method is to form a capacitor preventing the diffusion of oxygen and the increase of leakage current in the process of depositing a dielectric film(29) in the high temperature oxygen atmosphere on a bottom electrode, by forming the bottom electrode of a capacitor having the dielectric film formed in the high temperature oxygen atmosphere such as (Ba, Sr)TiO3 in the double film structure of an Ir film(27) and a Pt film(28, 31).
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申请公布号 |
KR20000003462(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024704 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
HONG, KWUN;CHO, HO JIN |
分类号 |
H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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