发明名称 METHOD OF FORMING CAPACITOR HAVING BOTTOM ELECTRODE OF DOUBLE FILM STRUCTURE OF IRIDIUM FILM AND PLATINUM FILM
摘要 PURPOSE: The method improves the characteristics of preventing the oxygen diffusion and prevents the increase of leakage current. CONSTITUTION: The method is to form a capacitor preventing the diffusion of oxygen and the increase of leakage current in the process of depositing a dielectric film(29) in the high temperature oxygen atmosphere on a bottom electrode, by forming the bottom electrode of a capacitor having the dielectric film formed in the high temperature oxygen atmosphere such as (Ba, Sr)TiO3 in the double film structure of an Ir film(27) and a Pt film(28, 31).
申请公布号 KR20000003462(A) 申请公布日期 2000.01.15
申请号 KR19980024704 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 HONG, KWUN;CHO, HO JIN
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L27/04 主分类号 H01L27/04
代理机构 代理人
主权项
地址