发明名称 METHOD FOR DISCRIMINATING DEFECTIVE CHIPS ON A MEMORY MODULE
摘要 PURPOSE: A defective chip discrimination method is provided to make an easy analysis of defective chips on a memory module by adding signature fuses to data pins. CONSTITUTION: The method is adapted to a memory module where plural memory chip are located in parallel, write enable pins of the respective memory chips are shared, and data pins thereof are coupled individually. The method includes supplying currents the data pins of the chips individually, detecting currents on output terminals of the chips, and comparing the output currents with predetermined reference currents.
申请公布号 KR20000002764(A) 申请公布日期 2000.01.15
申请号 KR19980023672 申请日期 1998.06.23
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 PARK. SEUNG WUN;HONG, JUNG IL;KIM, YEUNG CHUL
分类号 G01R31/02;(IPC1-7):G01F31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址