发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR USING HEMISPHERICAL GRAIN SILICON LAYER
摘要 PURPOSE: A method is to form a capacitor by using a hemispherical grain silicon layer to improve the characteristics of a memory cell. CONSTITUTION: A method is to form a hemispherical grain silicon layer(19) having grains of different size on the surface of a bottom electrode pattern(18) by forming the bottom electrode pattern comprising a crystalline layer(15) and an amorphous layer on a semiconductor substrate. The method minimizes the reduction of the surface area of the bottom electrode and prevents neighboring bottom electrodes from being connected.
申请公布号 KR20000000566(A) 申请公布日期 2000.01.15
申请号 KR19980020240 申请日期 1998.06.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, BYUNG RYUL;LEE, MYOUNG BUM;MOON, KWANG JIN;NAM, KAP JIN
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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