发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR USING HEMISPHERICAL GRAIN SILICON LAYER |
摘要 |
PURPOSE: A method is to form a capacitor by using a hemispherical grain silicon layer to improve the characteristics of a memory cell. CONSTITUTION: A method is to form a hemispherical grain silicon layer(19) having grains of different size on the surface of a bottom electrode pattern(18) by forming the bottom electrode pattern comprising a crystalline layer(15) and an amorphous layer on a semiconductor substrate. The method minimizes the reduction of the surface area of the bottom electrode and prevents neighboring bottom electrodes from being connected.
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申请公布号 |
KR20000000566(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980020240 |
申请日期 |
1998.06.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, BYUNG RYUL;LEE, MYOUNG BUM;MOON, KWANG JIN;NAM, KAP JIN |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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