发明名称 |
CAPACITOR PRODUCTION METHOD FOR SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A capacitor production method for a semiconductor memory device is provided to prevent a bridge among storage electrodes and the pollution of semiconductor substrates by particles of HSG film. CONSTITUTION: The capacitor for a semiconductor memory device is produced in the process of; forming an insulation layer(104) on the semiconductor substrate(100); etching the insulation layer(104) until the surface of the semiconductor substrate(100) is exposed and forming a contact hole(105); forming a conductive film(106) on the insulation layer(104); forming a photoresist pattern(108) on the conductive film(106) to form a storage electrode.
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申请公布号 |
KR20000002486(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980023273 |
申请日期 |
1998.06.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SIN, SOONG MOK;BYUN, JAE HO;YU, YONG SOB |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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