发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES
摘要 PURPOSE: A fabrication method of semiconductor devices including an ion-implanting process is provided to prevent a channeling phenomenon without a slope ion-implanting. CONSTITUTION: The method comprises the steps of: manufacturing a wafer(30) by slicing an ingot, wherein the cutting plane of the wafer(30) and the crystalline plane of the ingot have an off-cut angle(theta); and ion-implanting dopants to the wafer(30) by substantially vertical direction. Before the ion-implanting step, a step of forming a screen oxide layer of the wafer(30) is further comprised. The off-cut angle has plus or minus 1-10 degrees.
申请公布号 KR20000001331(A) 申请公布日期 2000.01.15
申请号 KR19980021539 申请日期 1998.06.10
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 MIN, KYUNG YEOL
分类号 H01L21/265;H01L21/304;(IPC1-7):H01L21/265 主分类号 H01L21/265
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