发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A fabrication method of semiconductor devices including an ion-implanting process is provided to prevent a channeling phenomenon without a slope ion-implanting. CONSTITUTION: The method comprises the steps of: manufacturing a wafer(30) by slicing an ingot, wherein the cutting plane of the wafer(30) and the crystalline plane of the ingot have an off-cut angle(theta); and ion-implanting dopants to the wafer(30) by substantially vertical direction. Before the ion-implanting step, a step of forming a screen oxide layer of the wafer(30) is further comprised. The off-cut angle has plus or minus 1-10 degrees.
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申请公布号 |
KR20000001331(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980021539 |
申请日期 |
1998.06.10 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
MIN, KYUNG YEOL |
分类号 |
H01L21/265;H01L21/304;(IPC1-7):H01L21/265 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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